How high-density connector inspection impacts high-performance compute manufacturing
The most common pin defects in data connectors
The limitations of traditional inspection methods
What Instrumental’s AI with Synchronized Learning technology is and how it functions
Differences and benefits of anomaly detection with synchronized learning compared to conventional AOI
How Instrumental achieves a 98% defect detection rate on day one
Results from a real-world comparison of Instrumental, Koh Young, and Delvitech
