How Instrumental's AI with Synchronized Learning Intercepts 98% of Pin Defects from Day 1

Three pages of a case study stacked with a drop shadow.

Download the White Paper

Learn about Instrumental's unique approach to high density pin inspection.

In this white paper, you will learn:

  • How high-density connector inspection impacts high-performance compute manufacturing

  • The most common pin defects in data connectors

  • The limitations of traditional inspection methods

  • What Instrumental’s Synchronized AI technology is and how it functions

  • Differences and benefits of anomaly detection with synchronized learning compared to conventional AOI

  • How Instrumental achieves a 98% defect detection rate on day one

  • Results from a real-world comparison of Instrumental, Koh Young, and Delvitech

Increase your L6-L10 throughput.

Ensure connector defects never cause costly rework, delayed product launches, compromised performance, or missed production targets.