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Accelerate your NPI Programs

For engineering teams trying to hit their NPI deadlines, dealing with complex electronics assembly or a new manufacturing partner. Aggregate all your data, find novel defects using AI, and accelerate failure analysis with powerful failure analysis tools.

Connect all your siloed data

Gather visual and parametric data from various sources such as cameras, AOI, X-ray, test stations, or Instrumental Stations into a traceable data record for all your units.

Discover novel defects on day one

Use the anomaly-detecting AI to start surfacing unknown defects in your design. It continuously learns from your feedback, compares new units to a normal unit, and only needs five units to get started.

Conduct virtual teardowns

Virtually explore serialized units and each step of their assembly process through a simple user interface. Leverage deep visual search to explore multiple units at once.

Accelerate failure analysis

Identify and eliminate all potential root causes by running comprehensive analyses in minutes. AI finds relationships between functional failures, data and images.

Generate new data instantly

Retroactively measure any dimension using AI without the hassle of manual measurements. The AI can be trained in less than 10 minutes using just 30 samples. Once trained, it can quickly and efficiently measure hundreds of samples, which can be used to analyze failures or identify drifts and shifts.